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Webinars

Using DEKTAK Stylus Profiler

To measure: Surface Roughness, Film Stress, and Step Height

Elionix Training

Elionix Training

Edmond Chow, Holonyak MNTL Senior Process Engineer
Introduction to Plasma Processing:  Part 1 - Etch

Introduction to Plasma Processing: Part 1 - Etch

Karthick Jeganathan, Holonyak MNTL Research Engineer
Understanding Vacuum, Systems, and Parts

Understanding Vacuum, Systems, and Parts

Mark McCollum, Holonyak MNTL Principal Research Engineer
Engineering Resist Profile for Liftoff Applications

Engineering Resist Profile for Liftoff Applications

Edmond Chow, Holonyak MNTL Senior Process Engineer
Using Contrast Curve in Electron Beam Lithography (EBL) Process Development

Using Contrast Curve in Electron Beam Lithography (EBL) Process Development

Edmond Chow, Holonyak MNTL Senior Process Engineer