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MDC802 Mercury probe

MDC802 Mercury probe

Photo of MDC802 Mercury probe

The MDC802 Mercury probe provides a convenient way of electrical measurement of semiconductor samples (>2x2cm) by probing wafers wtih mercury to form contacts of well-defined area. It can be connected to C-V plotters, or computerized semiconductor measurement system (not included) with BNC cable.

Operating procedure (.pdf file)
For more information contact Edmond Chow (echow@illinois.edu)