MDC802 Mercury probe
The MDC802 Mercury probe provides a convenient way of
electrical measurement of semiconductor samples (>2x2cm) by probing wafers wtih mercury to form contacts
of well-defined area. It can be connected to C-V plotters, or computerized semiconductor measurement system
(not included) with BNC cable.
Operating procedure (.pdf file)
For more information contact Edmond Chow (firstname.lastname@example.org)