Gaertner LSE Ellipsometer
The Gaertner LSE Ellipsometer
uses advanced StokesMeter™ technology with no moving parts and no modulators to quickly and accurately determine the complete polarization state of
the laser measuring beam at a 70° incidence angle. Our system is equipped with three lasers of wavelength 405nm,633nm and 830nm.
It can easily measure down to 1nm SiO2 or SiN film on Si.
The sample stage (accomodate up 8 inch wafer) can be easily moved by hand to measure any point on the sample surface.
The sample table includes a manual tilt and table height adjustment which is set using an alignment screen on the computer.
||Screenshot of GEMP (Gaertner Ellipsometer Program)
Operating procedure (.pdf file)
Calculating Cauchy Coefficient (.xlsx file)
For more information contact Edmond Chow (firstname.lastname@example.org)