facilities
Highlights
Device Characterization Lab
The Device Characterization Lab (Rm 1371) is located in the first floor of the building. Equipment in the lab will be accessible to all MNTL users. Below are a list of equipment currently (or in near future) housed in the lab:
- Accent Hall Effect Measurement System
- Renishaw Raman/PL Micro-spectroscopy System
- Room temperature Probe Station
- Kulicke & Soffa 4524AD wire bonder
- InfraScope Micro-Thermal Imager (QFI)
- MDC802 Mercury probe
- Metricon Model 2010M Prism Coupler
- Agilent 4155B Semiconductor Parameter Analyzer
- Agilent 4263B LCR Meter (100Hz to 100kHz)
- Agilent 4395A Network/Spectrum/Impedance Analyzer (10Hz-500MHz)
- Agilent 33120A Function Generator 15MHz
- Agilent 34401A Digital Multimeter
Please contact Edmond Chow (echow@uiuc.edu ) if you have questions or comments.